In situ Elastic Strain Measurements-Diffraction and Spectroscopy
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چکیده
منابع مشابه
Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction
We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed significant anelastic deformation, which was independently confirmed by strain rate experiments. Furthermore,...
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